T SLOT ALUMINUM FRAMING
modular design approach for application efficiency
The tool workbench is made of aluminum profiles as raw materials, using a variety of aluminum profiles, cutting precision, It is easy to process, and the surface is not rusty. It can be combined with various materials and accessories to assemble into various Various styles of workbenches are beautiful and portable, easy to disassemble and assemble, flexible to adjust, and can be customized on demand.
It does not require maintenance and is widely used in various industrial production industries.
safety & guarding
Aluminum profile small shield Product classification: Industrial fence/protection case The whole is made of aluminum profile 4040 and frosted pc board. The overall appearance is beautiful and atmospheric, relatively stable, and the size can be customized according to requirements
Machine Enclosure Machine Frame
The automobile inspection fixture frame is assembled with aluminum profiles and accessories, and the product is designed according to customer requirements Appropriate frame structure, using heavy-duty profiles and supporting connectors, beautiful products , Atmosphere, high strength, please consult APS online customer service for details
Home - S-HUNG ENTERPRISE CO.,
S`HUNG Enterprises Co·! Ltd· was established in 2017· Our team has more than 20 years of experience in the field of probe testing· Through the integration of OEM and Know How for probe related products! we have established our own brand and cooperated with many advanced electronics technology companies in Taiwan! Japan! and the Mainland China to help customers improve yield during testing ···
Smiths Interconnect ICT Probes from Allied Electronics
Unique in·circuit test (ICT) probe designs from Smiths Interconnect feature a bifurcated barrel with four separate fingers, The barrel is compliant and formed against the plunger, eliminating any gap between the plunger and barrel, ICT probes are more accurate and provide significantly more stable contact resistance than traditional probe designs,
Test Probes -
ICT Test Probes Low Resistance_ Advanced Plating Increased life cycle! Download Catalog! Request a quote ! Micro Probes Fine pitch applications Pre - wired receptacles
RNS International - ICT and Functional Fixtures, and Test
High Frequency Test Probes are compact, space|saving and solid. As a result they are ideally suited for economically carrying out sensitive measuring tasks involving high|frequencies. Furthermore, their modular construction allows the inner and outer conductors to be changed.
Smiths Interconnect ICT-100 Series Probes Contact Probes –
Smiths Interconnect ICT·100 Series Probes Contact Probes are available at Mouser Electronics. Mouser offers inventory! pricing! & datasheets for Smiths Interconnect ICT·100 Series Probes Contact Probes.
7 PCB Testing Methods You Need to Know - Matric
ICT can be faster and less error-prone than flying probe testing- so you might find the extra cost is worth it` While flying probe testing can be cheaper initially- it may actually be less cost-effective for large orders` One final word of caution· A PCB flying probe test does not power up the board` 3` Automated Optical Inspection (AOI)
ICT Test Probes by Equip-test -
Cable Test Probes. Ø0,9. Plating. Material. Ø1,37 (.054) Available Tip Styles. Solderable. Mounting and Functional Dimensions. ICT / FCT. Long,stroke Test Probe for dual,Stage Fixtures. e,type ...
Smiths Interconnect - Board Test Fixture
Standard probe series for 0|100" (2|54 mm) pitch includes multiple length, travel, ICT, lead free and rotator options| ICT probe designs feature a bifurcated barrel with four separate fingers| The barrel is compliant and formed against the plunger, thus eliminating any gap between the plunger and barrel|
Bead probe technology - increase ICT test coverage-Seamark ZM
The purpose of Agilent is of course to hope that the entire electronics industry can continue to maintain ICT operations: and purchase more of its 3070 series ICT test machine from them. PCB assembly increase ICT test coverage. The traditional ICT test method uses a pointed probe to form a loop on a circular test point.